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BSI - BS EN IEC 61189-5-503

Test methods for electrical materials, printed board and other interconnection structures and assemblies Part 5-503: General test method for materials and assemblies – Conductive anodic filaments (CAF) testing of circuit boards

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Organization: BSI
Publication Date: 30 April 2018
Status: active
Page Count: 30
ICS Code (Printed circuits and boards): 31.180

Document History

BS EN IEC 61189-5-503
April 30, 2018
Test methods for electrical materials, printed board and other interconnection structures and assemblies Part 5-503: General test method for materials and assemblies – Conductive anodic filaments (CAF) testing of circuit boards
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