DS/EN IEC 60749-13
Semiconductor devices – Mechanical and climatic test methods – Part 13: Salt atmosphere
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| Organization: | DS |
| Publication Date: | 16 April 2018 |
| Status: | active |
| Page Count: | 18 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
<span lang="EN-US">IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. </span>The salt atmosphere test is considered destructive. This edition includes the following significant technical changes with respect to the previous edition: a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).
Document History
DS/EN IEC 60749-13
April 16, 2018
Semiconductor devices – Mechanical and climatic test methods – Part 13: Salt atmosphere
<span lang="EN-US">IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects...