NEN-EN-IEC 60749-2
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 September 2002 |
| Status: | active |
| Page Count: | 26 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures. This test is only applicable to devices where the operating voltage exceeds 1000 V.
Document History
NEN-EN-IEC 60749-2
September 1, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to...