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NEN 10444-1

Measurement of quartz crystal unit parameters by zero phase technique in a π-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a Π-network

inactive, Most Current
Organization: NEN
Publication Date: 1 February 1987
Status: inactive
ICS Code (Piezoelectric devices): 31.140
scope:

This standard specifies a simple method of measurement of resonance frequency and resonance resistance of quartz crystal units and describes a suitable measuring network. The measuring method and the network are suitable for use over the frequency range 1 MHz to 200 MHz with a fractional frequency accuracy of the order of 10--<(su p)>-6 with a reproducibility of 10-8 depending on the type of crystal unit being measured, and an accuracy of the measurement of resonance resistance of ± 2% to ± 5% depending on the accuracy of the voltage measurement. However, above approximately 100 MHz the use of this measuring method is limited by the effects of the shunt capacitance C<(9inf)0> of the crystal unit under test. To enable the measuring method to be used under these conditions, the use of some method of C0 compensation is advisable.

Document History

NEN 10444-1
February 1, 1987
Measurement of quartz crystal unit parameters by zero phase technique in a π-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a Π-network
This standard specifies a simple method of measurement of resonance frequency and resonance resistance of quartz crystal units and describes a suitable measuring network. The measuring method and the...
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