NEN - NPR-IEC/PAS 62336
Accelerated moisture resistance - Unbiased HAST
inactive, Most Current
| Organization: | NEN |
| Publication Date: | 1 September 2002 |
| Status: | inactive |
| Page Count: | 18 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
The Unibiased HAST is performed for thepurpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. It is a highly accelerated test which employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it.
Document History
NPR-IEC/PAS 62336
September 1, 2002
Accelerated moisture resistance - Unbiased HAST
The Unibiased HAST is performed for thepurpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. It is a highly accelerated test which employs...