NEN-EN-IEC 60749-27/A1
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 November 2012 |
| Status: | active |
| Page Count: | 10 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
NEN-EN-IEC 60749-27/A1
November 1, 2012
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
A description is not available for this item.
November 1, 2007
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
This part of IEC 60749 establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine...