NEN - NPR-IEC/PAS 62189
Bias Life
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 February 2001 |
| Status: | active |
| Page Count: | 18 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Performed to determine the effects of bias conditions and temperature on solid state devices over an extended period of time. It is intended primarily for device Qualification and reliability monitoring.
Document History
NPR-IEC/PAS 62189
February 1, 2001
Bias Life
Performed to determine the effects of bias conditions and temperature on solid state devices over an extended period of time. It is intended primarily for device Qualification and reliability...