NEN-ISO 6342
Micrographics - Aperture cards - Method of measuring thickness of buildup area
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 August 2003 |
| Status: | active |
| Page Count: | 10 |
| ICS Code (Document imaging applications): | 37.080 |
scope:
This International Standard specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.
Document History
NEN-ISO 6342
August 1, 2003
Micrographics - Aperture cards - Method of measuring thickness of buildup area
This International Standard specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.