NEN-EN-IEC 60749-12
Semiconductor devices - Mechanical en climatic test methods - Part 12: Vibration, variable frequency
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 September 2002 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Describes a test to determine the effect of varibale frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages.
Document History
NEN-EN-IEC 60749-12
September 1, 2002
Semiconductor devices - Mechanical en climatic test methods - Part 12: Vibration, variable frequency
Describes a test to determine the effect of varibale frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable...