NEN - NPR-IEC/PAS 62203
Guide for the standard probe pad sizes and layouts for water-level electrical testing
inactive, Most Current
| Organization: | NEN |
| Publication Date: | 1 February 2001 |
| Status: | inactive |
| Page Count: | 16 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Applies to double- and single-column arrays of metal probe pads, on a semiconductor wafer or chip, that are electrically connected to one or more test structures.
Document History
NPR-IEC/PAS 62203
February 1, 2001
Guide for the standard probe pad sizes and layouts for water-level electrical testing
Applies to double- and single-column arrays of metal probe pads, on a semiconductor wafer or chip, that are electrically connected to one or more test structures.