NEN 10147-3
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 3: Reference methods of measurement
inactive, Most Current
| Organization: | NEN |
| Publication Date: | 1 July 1973 |
| Status: | inactive |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Deals with the guiding principles in selecting reference methods and thermal conditions of electrical reference measurements, and transistors. The first supplement deals with VCEsat, (cursief)h>21e) and h21e for transistors
Document History
NEN 10147-3
July 1, 1973
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 3: Reference methods of measurement
Deals with the guiding principles in selecting reference methods and thermal conditions of electrical reference measurements, and transistors. The first supplement deals with VCEsat, (cursief)h>21e)...