NEN-IEC 61445
Digital Test Interchange Format (DTIF)
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 June 2012 |
| Status: | active |
| Page Count: | 114 |
| ICS Code (Languages used in information technology): | 35.060 |
| ICS Code (Industrial automation systems): | 25.040 |
scope:
This standard deÞnes the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that deÞnes the following: a) UUT Model; b) Stimulus and Response; c) Fault Dictionary; d) Probe.
Document History
NEN-IEC 61445
June 1, 2012
Digital Test Interchange Format (DTIF)
This standard deÞnes the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit...