NEN 10444-2
Measurement of quartz crystal unit parameters by zero phase technique in a π-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
inactive, Most Current
| Organization: | NEN |
| Publication Date: | 1 June 1982 |
| Status: | inactive |
| ICS Code (Piezoelectric devices): | 31.140 |
scope:
This standard describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%. The advantage of this method is that it used only the measuring circuit described in IEC Publication 444 and therefore avoids the use of additional elements or instruments which could be sources of error.
Document History
NEN 10444-2
June 1, 1982
Measurement of quartz crystal unit parameters by zero phase technique in a π-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
This standard describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%. The advantage...