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NEN 11163-1

Reliability stress screening - Repairable items manufactured in lots

inactive, Most Current
Organization: NEN
Publication Date: 1 October 1995
Status: inactive
Page Count: 160
ICS Code (Application of statistical methods): 03.120.30
scope:

Describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware items, in cases where the items have an unacceptably low reliability in the early failure period, and when other methods, like reliability growth programmes and quality control techniques, are not applicable.

Document History

NEN 11163-1
October 1, 1995
Reliability stress screening - Repairable items manufactured in lots
Describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware items, in cases where the items have an unacceptably low reliability in the...

References

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