NEN-EN-IEC 60512-25-6
Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 August 2004 |
| Status: | active |
| Page Count: | 48 |
| ICS Code (Plug-and-socket devices. Connectors): | 31.220.10 |
scope:
Describes mehtods for measuring an eye pattern response and jitter in the time domain.
Document History
NEN-EN-IEC 60512-25-6
August 1, 2004
Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter
Describes mehtods for measuring an eye pattern response and jitter in the time domain.