NEN-EN-IEC 60749-4
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, highly accelerated stress test (HAST)
inactive
| Organization: | NEN |
| Publication Date: | 1 September 2002 |
| Status: | inactive |
| Page Count: | 28 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
Document History
July 1, 2017
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
NEN-EN-IEC 60749-4 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid...
NEN-EN-IEC 60749-4
September 1, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, highly accelerated stress test (HAST)
Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.