NEN-EN-IEC 60749-17
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 June 2003 |
| Status: | active |
| Page Count: | 24 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
The neutron irradiation is performed to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices. This test is intended for military- and space-related applications. It is a destructive test.
Document History
NEN-EN-IEC 60749-17
June 1, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
The neutron irradiation is performed to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor...