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NEN-EN-IEC 62047-3

Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing

active, Most Current
Organization: NEN
Publication Date: 1 October 2006
Status: active
Page Count: 33
ICS Code (Other semiconductor devices): 31.080.99
scope:

This International Standard specifies a standard test piece, which is used to guarantee the propriety and accuracy of a tensile testing system for thin film materials with length and width under 1 mm and thickness under 10 m, which are main structural materials for microelectromechanical systems (MEMS), micromachines and similar devices. This International Standard is based on such a concept that a tensile testing system can be guaranteed in propriety and accuracy, when the measured tensile strengths of the standard test pieces, whose tensile strength is pre-determined, are within the designated range. It also specifies the test pieces to minimize characteristics deviation among the pieces.

Document History

NEN-EN-IEC 62047-3
October 1, 2006
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
This International Standard specifies a standard test piece, which is used to guarantee the propriety and accuracy of a tensile testing system for thin film materials with length and width under 1 mm...
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