NEN-EN-IEC 62047-3
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
| Organization: | NEN |
| Publication Date: | 1 October 2006 |
| Status: | active |
| Page Count: | 33 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
scope:
This International Standard specifies a standard test piece, which is used to guarantee the propriety and accuracy of a tensile testing system for thin film materials with length and width under 1 mm and thickness under 10 m, which are main structural materials for microelectromechanic
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