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NEN-IEC 62527

Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification

active, Most Current
Organization: NEN
Publication Date: 1 December 2007
Status: active
Page Count: 46
ICS Code (Industrial automation systems): 25.040
scope:

This standard defines the following: a) Defines the structures in STIL for specifying the DC conditions for a DUT. Exaples of the DC conditions for device power supplies are DSP setup, power sequencing to the device, and power supply limiting/clamping. Examples of the DC conditions for commonly used signal references are VIL, VIH, VOL, VOH, IOL, IOH, VREF, VClampLow, and VClampHi.b) Defines strucuresin STIL such that the DC conditions may be specified either globally, by pattern burst, by pattern or by vector. c) Defines structures in STIL to allow specifications of the alternate DC levels. Examples of commonly used alternate levels are VIHH, VIPP, and VILL. d) Defines structures in STIL such that the DC levels and alternate levels can be selected within a period, much the same as timed format events.

Document History

NEN-IEC 62527
December 1, 2007
Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification
This standard defines the following: a) Defines the structures in STIL for specifying the DC conditions for a DUT. Exaples of the DC conditions for device power supplies are DSP setup, power...
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