NEN 10147-4
Semiconductor devices - Part 4: Acceptance and reliability
inactive, Most Current
| Organization: | NEN |
| Publication Date: | 31 May 1978 |
| Status: | inactive |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Gives conditions for electrical tests, for different temperature conditions and for different durations, as well as failure-defining characteristics and failure criteria, which are standardized for each device category. This permits a unique and easy comparison of data presented by different manufacturers, relative to acceptance testing as well as to reliability testing. Deals with semiconductor devices and digital integrated circuits (bipolar, MOS, multi-chip and hybrid circuits).
Document History
NEN 10147-4
May 31, 1978
Semiconductor devices - Part 4: Acceptance and reliability
Gives conditions for electrical tests, for different temperature conditions and for different durations, as well as failure-defining characteristics and failure criteria, which are standardized for...