NEN 10747-10
Semiconductor devices: Generic specifications for discrete devices and integrated circuits
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 April 1997 |
| Status: | active |
| Page Count: | 92 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Defines general procedures for quality assessment to be used in the IEQO System and gives general rules for: measurement methods of electrical characteristics;- climatic and mechanical tests;- endurance tests.
Document History
NEN 10747-10
April 1, 1997
Semiconductor devices: Generic specifications for discrete devices and integrated circuits
Defines general procedures for quality assessment to be used in the IEQO System and gives general rules for: measurement methods of electrical characteristics;- climatic and mechanical tests;-...
April 1, 1997
Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
A description is not available for this item.
April 1, 1997
Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
A description is not available for this item.
April 1, 1997
Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
A description is not available for this item.