scope:

This International Standard gives guidance on the handling of and the containers for specimens submitted forsurface chemical analysis. It is intended for the user of surface analysis services as an aid in understandingthe special sample handling requirements of surface chemical analysis techniques, particularly the followingAuger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS) and X-ray photoelectronspectroscopy (XPS or ESCA). The protocols presented may also be applicable to other analytical techniquessuch as TXRF, that are sensitive to surface composition. In particular instances, with particular specimensfurther precautions may be necessary.