NEN - NPR-ISO/TS 24597
Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 July 2011 |
| Status: | active |
| Page Count: | 96 |
| ICS Code (Optical equipment): | 37.020 |
scope:
This Technical Specification specifies methods of evaluating the sharpness of digitized images generated by a scanning electron microscope (SEM) by means of a Fourier transform (FT) method, a contrast-to-gradient
Document History
NPR-ISO/TS 24597
July 1, 2011
Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
This Technical Specification specifies methods of evaluating the sharpness of digitized images generated by a scanning electron microscope (SEM) by means of a Fourier transform (FT) method, a...