NEN-EN-IEC 60749-13
Semiconductor devices - Mechanical and climatic test methods'Part 13: Salt atmosphere
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 September 2002 |
| Status: | active |
| Page Count: | 26 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.
Document History
NEN-EN-IEC 60749-13
September 1, 2002
Semiconductor devices - Mechanical and climatic test methods'Part 13: Salt atmosphere
Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all...