NEN-EN-IEC 60749-36
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 June 2003 |
| Status: | active |
| Page Count: | 22 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
Document History
NEN-EN-IEC 60749-36
June 1, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses...