NEN - NPR-IEC/PAS 62204
Standard method for measuring and using the temperature coefficient of resistance to determine the temperature of a metallization line
inactive, Most Current
| Organization: | NEN |
| Publication Date: | 1 February 2001 |
| Status: | inactive |
| Page Count: | 34 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Is intended for determining the temperature coefficient of resistance (at a given reference temperature) of aluminium and aluminium-alloy thin-film metallizations that are used in microelectronic circuits and devices.
Document History
NPR-IEC/PAS 62204
February 1, 2001
Standard method for measuring and using the temperature coefficient of resistance to determine the temperature of a metallization line
Is intended for determining the temperature coefficient of resistance (at a given reference temperature) of aluminium and aluminium-alloy thin-film metallizations that are used in microelectronic...