NEN - NVN-ISO/TS 13762
Particle size analysis - Small angle X-ray scattering method
inactive, Most Current
| Organization: | NEN |
| Publication Date: | 15 March 2001 |
| Status: | inactive |
| Page Count: | 34 |
| ICS Code (Particle size analysis. Sieving): | 19.120 |
scope:
Specifies the method for determining particle size distribution of ultra -fine powders by the small angle X-ray scattering technique. It is applicable to particle sizes ranging from 1 nm to 300 nm. In the data analysis, it is assumed that particles are isotropic and spherically shaped.
Document History
NVN-ISO/TS 13762
March 15, 2001
Particle size analysis - Small angle X-ray scattering method
Specifies the method for determining particle size distribution of ultra -fine powders by the small angle X-ray scattering technique. It is applicable to particle sizes ranging from 1 nm to 300 nm....