NEN 10444-3
Measurement of quartz crystal unit parameters by zero phase technique in a π-network - Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a π-network with compensation of the parallel capacitance C₋₀
inactive, Most Current
| Organization: | NEN |
| Publication Date: | 1 December 1986 |
| Status: | inactive |
| ICS Code (Piezoelectric devices): | 31.140 |
scope:
This report specifies a method for the measurement of the parameters of quartz crystal units using a inductance to compensate for the effects of C0 at the frequency of the crystal unit with accuracy depending on the type of crystals for: a) frequency with a fractional accuracy ranging between 10-6 and 10-8; b) resistance with a fractional accuracy ranging between 2% and 5%; c) motional capacitance and motional inductance with a fractional accuracy ranging between 3% and 7%.
Document History
NEN 10444-3
December 1, 1986
Measurement of quartz crystal unit parameters by zero phase technique in a π-network - Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a π-network with compensation of the parallel capacitance C₋₀
This report specifies a method for the measurement of the parameters of quartz crystal units using a inductance to compensate for the effects of C0 at the frequency of the crystal unit with accuracy...