NEN-EN-IEC 60749-5
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 July 2017 |
| Status: | active |
| Page Count: | 22 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
NEN-EN-IEC 60749-5 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. This test method is considered destructive.
Document History
NEN-EN-IEC 60749-5
July 1, 2017
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
NEN-EN-IEC 60749-5 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments....
July 1, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Provides a steady-state temperature and humidity bias life for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.