UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

NEN-EN-IEC 61709

Electronic components - Reliability - Reference conditions for failure rates and stress models for conversion

inactive
Organization: NEN
Publication Date: 1 May 1998
Status: inactive
Page Count: 100
ICS Code (Electronic components in general): 31.020
scope:

Gives guidance on the use of failure rate data for the reliability prediction of components in electronic equipment. Reference conditions for failure rate data are specified, so that data from different sources can be compared. The reference conditions adopted are typical of the majority of applications of components in equipment (e.g. telecommunication use, data processing). It is assumed that the failure rate used under reference conditions is specific to the component i.e. it includes the effect complexity, technology of the casing, dependence on manufacturers and the manufacturing process, etc.

Document History

May 1, 2017
Electric components - Reliability - Reference conditions for failure rates and stress models for conversion
NEN-EN- IEC 61709 gives guidance on the use of failure rate data for reliability prediction of electric components used in equipment. The method presented in this document uses the concept of...
August 1, 2011
Electric components - Reliability - Reference conditions for failure rates and stress models for conversion
This International Standard gives guidance on how failure rate data can be employed for reliability prediction of electric components in equipment. Reference conditions are numerical values of...
NEN-EN-IEC 61709
May 1, 1998
Electronic components - Reliability - Reference conditions for failure rates and stress models for conversion
Gives guidance on the use of failure rate data for the reliability prediction of components in electronic equipment. Reference conditions for failure rate data are specified, so that data from...
Advertisement