NEN-IEC 63003
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 January 2016 |
| Status: | active |
| Page Count: | 179 |
| ICS Code (Industrial automation systems): | 25.040 |
scope:
The scope of IEC 63003 is the definition of a pin map utilizing the IEEE 1505™ 1 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.
Document History
NEN-IEC 63003
January 1, 2016
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™
The scope of IEC 63003 is the definition of a pin map utilizing the IEEE 1505™ 1 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace...