NEN-EN-IEC 60444-3
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a pi-network with compensation of the parallel capacitance C₋₀
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 August 1997 |
| Status: | active |
| Page Count: | 42 |
| ICS Code (Piezoelectric devices): | 31.140 |
scope:
This report specifies a method for the measurement of the parameters of quartz crystal units using a inductance to compensate for the effects of C0 at the frequency of the crystal unit with accuracy depending on the type of crystals for: a) frequency with a fractional accuracy ranging between 10-6 and 10-8; b) resistance with a fractional accuracy ranging between 2% and 5%; c) motional capacitance and motional inductance with a fractional accuracy ranging between 3% and 7%.
Document History
NEN-EN-IEC 60444-3
August 1, 1997
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a pi-network with compensation of the parallel capacitance C₋₀
This report specifies a method for the measurement of the parameters of quartz crystal units using a inductance to compensate for the effects of C0 at the frequency of the crystal unit with accuracy...