NEN-EN-IEC 60749-18
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 July 2003 |
| Status: | active |
| Page Count: | 42 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source. Proposes an accelerated annealing test for estimating low dose rate ionizing radiation effects on devices. This annealing test is important for low dose rate or certain other applications in which devices may exhibit significant time-dependent effects. It is intended for military- and space-related applications.
Document History
NEN-EN-IEC 60749-18
July 1, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
Provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a...