NEN-EN-IEC 60512-6-2
Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test - 6b: Bump
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 May 2002 |
| Status: | active |
| Page Count: | 26 |
| ICS Code (Plug-and-socket devices. Connectors): | 31.220.10 |
scope:
This part of IEC 60512, when required by the detail specification, is used for testing electromechnical components within the scope of IEC technical committee 48. This test mat also be used for similar devices when specified in a detail specification. The object of this test is to define a standard test method to assess the ability of components to withstand specified severities of bump.
Document History
NEN-EN-IEC 60512-6-2
May 1, 2002
Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test - 6b: Bump
This part of IEC 60512, when required by the detail specification, is used for testing electromechnical components within the scope of IEC technical committee 48. This test mat also be used for...