NEN - NPR-IEC/PAS 62191
Acoustic microscopy for nonhermetic encapsulated electronic components
inactive, Most Current
| Organization: | NEN |
| Publication Date: | 1 February 2001 |
| Status: | inactive |
| Page Count: | 24 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Defines the procedures for performing acoustic microscopy on nonhermetic encapsulated electronic components. This method provides users with an acoustic microscopy process flow for detecting anomalies (delamination, cracks, mold compound voids, etc) nondestructively in plastic packages while achieving reproducibility.
Document History
NPR-IEC/PAS 62191
February 1, 2001
Acoustic microscopy for nonhermetic encapsulated electronic components
Defines the procedures for performing acoustic microscopy on nonhermetic encapsulated electronic components. This method provides users with an acoustic microscopy process flow for detecting...