NEN-EN-IEC 61189-5-503
Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 August 2017 |
| Status: | active |
| Page Count: | 36 |
| ICS Code (Printed circuits and boards): | 31.180 |
scope:
NEN-EN-IEC 61189-5-503 specifies the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperaturehumidity cyclic test and an unsaturated pressurized vapour test (HAST).
Document History
NEN-EN-IEC 61189-5-503
August 1, 2017
Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards
NEN-EN-IEC 61189-5-503 specifies the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperaturehumidity...