NEN - NPR-IEC/PAS 62205
High temperature storage life
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 February 2001 |
| Status: | active |
| Page Count: | 14 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
To determine the effect on solid state electronic device of storage at elevated temperature without electrical stress applied. This test is considered destructive and. therefore, is applicable for device qualification.
Document History
NPR-IEC/PAS 62205
February 1, 2001
High temperature storage life
To determine the effect on solid state electronic device of storage at elevated temperature without electrical stress applied. This test is considered destructive and. therefore, is applicable for...