NEN-EN 12698-2
Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 April 2007 |
| Status: | active |
| Page Count: | 19 |
| ICS Code (Chemical analysis): | 71.040.40 |
scope:
This standard describes methods for the determination of mineralogical phases typically apparent in nitride and oxy-nitride bonded silicon carbide refractory products using a Bragg-Brentano diffractometer. It includes details of sample preparation and general principles for qualitative and quantitative analysis of mineralogical phase composition. Quantitative determination of -Si3N4, -Si3N4, Si2ON2, AlN, and SiAlON are described.
Document History
NEN-EN 12698-2
April 1, 2007
Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods
This standard describes methods for the determination of mineralogical phases typically apparent in nitride and oxy-nitride bonded silicon carbide refractory products using a Bragg-Brentano...