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NEN-EN-IEC 61000-4-29

Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power ports immunity tests

active, Most Current
Organization: NEN
Publication Date: 1 January 2001
Status: active
Page Count: 51
ICS Code (Immunity): 33.100.20
scope:

Defines test methods for immunity to voltage dips, short interruptions and voltage variations at the d.c. input power port of electrical or electronic equipment.

Document History

NEN-EN-IEC 61000-4-29
January 1, 2001
Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power ports immunity tests
Defines test methods for immunity to voltage dips, short interruptions and voltage variations at the d.c. input power port of electrical or electronic equipment.

References

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