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NEN-EN-IEC 62228-2

Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers

active, Most Current
Organization: NEN
Publication Date: 1 February 2017
Status: active
Page Count: 99
ICS Code (Integrated circuits. Microelectronics): 31.200
scope:

NEN-EN-IEC 62228-2 specifies test and measurement methods for EMC evaluation of LIN transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for standard LIN transceiver ICs and ICs with embedded LIN transceiver and covers - the emission of RF disturbances, - the immunity against RF disturbances, - the immunity against impulses and - the immunity against electrostatic discharges (ESD).

Document History

NEN-EN-IEC 62228-2
February 1, 2017
Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers
NEN-EN-IEC 62228-2 specifies test and measurement methods for EMC evaluation of LIN transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure...
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