NEN-EN-IEC 62884-2
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 January 2018 |
| Status: | active |
| ICS Code (Piezoelectric devices): | 31.140 |
scope:
NEN-EN-IEC 62884-2 specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter. In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.
Document History
NEN-EN-IEC 62884-2
January 1, 2018
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
NEN-EN-IEC 62884-2 specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator...