NEN-IEC 62860
Test methods for the characterization of organic transistors and materials
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 August 2013 |
| Status: | active |
| Page Count: | 30 |
| ICS Code (Physics. Chemistry): | 07.030 |
scope:
This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
Document History
NEN-IEC 62860
August 1, 2013
Test methods for the characterization of organic transistors and materials
This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.