NEN-IEC 60748-23-2
Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 September 2002 |
| Status: | active |
| Page Count: | 106 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
scope:
Applies to high quality approval systems for hybrid integrated circuit and film structures. The purpose of the tests is to perform visual inspections on the internal materials, construction and workmanship of hybrid, multichip and multichip module microcircuits and passive elemets used for microelectronic applications including r.f./microwave.
Document History
NEN-IEC 60748-23-2
September 1, 2002
Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests
Applies to high quality approval systems for hybrid integrated circuit and film structures. The purpose of the tests is to perform visual inspections on the internal materials, construction and...