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NEN - NPR-IEC/PAS 62483

Test method for measuring whisker growth on tin and tin alloy surface finishes

active, Most Current
Organization: NEN
Publication Date: 1 October 2006
Status: active
Page Count: 37
ICS Code (Semiconductor devices in general): 31.080.01
scope:

The methodology presented in this document, see Annex A for process flow, is applicable for studying tin whisker growth from finishes containing a predominance of tin (Sn). This test method may not be sufficient for applications with special requirements, e.g., military or aerospace. Additional requirements may be specified in the appropriate requirements document. The purpose of this PAS is to; - Provide an industry-standardized suite of tests for measurement and comparison of whisker propensity for different plating or finish chemistries and processes. - Provide a consistent inspection protocol for tin whisker examination. - Provide a standard reporting format.

Document History

NPR-IEC/PAS 62483
October 1, 2006
Test method for measuring whisker growth on tin and tin alloy surface finishes
The methodology presented in this document, see Annex A for process flow, is applicable for studying tin whisker growth from finishes containing a predominance of tin (Sn). This test method may not...
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