NEN - NPR-IEC/PAS 62483
Test method for measuring whisker growth on tin and tin alloy surface finishes
| Organization: | NEN |
| Publication Date: | 1 October 2006 |
| Status: | active |
| Page Count: | 37 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
The methodology presented in this document, see Annex A for process flow, is applicable for studying tin whisker growth from finishes containing a predominance of tin (Sn). This test method may not be sufficient for applications with special requirements, e.g., military or aerospace. Additional requirements may be specified in the appropriate requirements document. The purpose of this PAS is to; - Provide an industry-standardize
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