NEN-EN-IEC 60444-8
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
inactive
| Organization: | NEN |
| Publication Date: | 1 November 2003 |
| Status: | inactive |
| Page Count: | 26 |
| ICS Code (Piezoelectric devices): | 31.140 |
scope:
Explains the test fixture that allows the accurate measurement of resonance frequency, resonance resistance, and equivalent electrical circuit parameters of a leadless surface mounted quartz crystal units over the frequency range from 1 MHz to 150 MHz using zero phase technique as specified in IEC 60444-4 and IEC 60444-5.
Document History
May 1, 2017
Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
NEN-EN- IEC 60444-8 describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts). These fixtures allow the measurement of...
NEN-EN-IEC 60444-8
November 1, 2003
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
Explains the test fixture that allows the accurate measurement of resonance frequency, resonance resistance, and equivalent electrical circuit parameters of a leadless surface mounted quartz crystal...