NEN - NVN-ENV 50218
Description of a parametrized European mini-chip
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 March 1996 |
| Status: | active |
| Page Count: | 22 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
| ICS Code (Applications of information technology): | 35.240 |
scope:
Documents the parameterized MOS test structure of the device model Parameter extraction Test Chip (PTC) of the European Mini Test Chip (ETC). The devices of the PTC are a subset of the devices of the ETC. The modules of the ETC provide a minimum set of test structures used to characterize a MOS technology. The test structures of the ETC are generated automatically by a computer program for a given MOS technology. The program also generates test structures which are designed to characterize reliability aspects of a MOS technology (Reliability Test Chip, RTC).
Document History
NVN-ENV 50218
March 1, 1996
Description of a parametrized European mini-chip
Documents the parameterized MOS test structure of the device model Parameter extraction Test Chip (PTC) of the European Mini Test Chip (ETC). The devices of the PTC are a subset of the devices of the...