NEN-EN-IEC 60749-6
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
inactive
| Organization: | NEN |
| Publication Date: | 1 September 2002 |
| Status: | inactive |
| Page Count: | 22 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Test and determine the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive but should preferably by used for device qualification.
Document History
July 1, 2017
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
The purpose of NEN-EN-IEC 60749-6 is to test and determine the effect on all solid state electronic devices of storage at elevated temperature without electrical stress applied. This test is...
NEN-EN-IEC 60749-6
September 1, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
Test and determine the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive but should...