NEN-EN-IEC 60747-5-3/A1
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectric devices - Measuring methods
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 June 2002 |
| Status: | active |
| Page Count: | 32 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
Document History
NEN-EN-IEC 60747-5-3/A1
June 1, 2002
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectric devices - Measuring methods
A description is not available for this item.
July 1, 2001
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectric devices - Measuring methods
Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.