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NEN - NPR-IEC/PAS 62201

A procedure for executing SWEAT

inactive, Most Current
Organization: NEN
Publication Date: 1 February 2001
Status: inactive
Page Count: 30
ICS Code (Semiconductor devices in general): 31.080.01
scope:

Describes an algorithm for executing of the Standard Wafer Level Electromigration Accelerated Test (SWEAT) on computer controlled instrumentation. The algorithm described represents one approach to the execution of SWEAT. Development and employment of other algorithms may produce satisfactory accelerated electromigration test results.

Document History

NPR-IEC/PAS 62201
February 1, 2001
A procedure for executing SWEAT
Describes an algorithm for executing of the Standard Wafer Level Electromigration Accelerated Test (SWEAT) on computer controlled instrumentation. The algorithm described represents one approach to...
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