NEN-EN-IEC 60444-4
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency f[L], load resonance resistance R[L] and the calculation of other derived values of quarz crystal units, up to 30 MHz
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 August 1997 |
| Status: | active |
| Page Count: | 36 |
| ICS Code (Piezoelectric devices): | 31.140 |
scope:
Specifies a simple method of measurement allowing calculation of load resonance frequency offset, frequency pulling range and pulling sensitivity. The method described uses the change in resonance frequency from fr to FL which occurs when a load capacitance CL is inserted in series with the crystal unit. Tha accuracy is determined mainly by the precision of the frequency measurement and the calibration of the load capacitor. An appendix gives recommendations regarding the use of load capacitors.
Document History
NEN-EN-IEC 60444-4
August 1, 1997
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency f[L], load resonance resistance R[L] and the calculation of other derived values of quarz crystal units, up to 30 MHz
Specifies a simple method of measurement allowing calculation of load resonance frequency offset, frequency pulling range and pulling sensitivity. The method described uses the change in resonance...